Request a Quote for Dynamic Industries Corp Part Number 7031-C-60 with the NSN 6625-00-008-0395

Part Number: 7031-C-60

Alternate P/N: 7031C60

Manufacturer: Dynamic Industries Corp

NSN: 6625-00-008-0395

NIIN: 000080395

Item Name : Lead Test

CAGE Code: 55314

FSC: 6625 Electrical and Electronic Properties Measuring and Testing Instruments

FSG: 66 Instruments and Laboratory Equipment

Country : USA

NCB Code : 00

Aerospace Engineering Solutions is proud to offer immediate purchasing options on Dynamic Industries Corp part number 7031-C-60, a Lead Test product we carry that is listed with the NSN 6625-00-008-0395 for ease of identification. If you would like to learn more about this item, be sure to complete the Request for Quote (RFQ) form provided on this page. By including essential details like your target price, desired quantity, and expected fulfillment timeline, you are ensured a fully customized quote from our team.

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For your reference, this product is traceable to Dynamic Industries Corp through the CAGE Code 55314, as well as categorized under FSC 6625 Electrical and Electronic Properties Measuring and Testing Instruments based on the first four digits of the NSN 6625-00-008-0395. Using such information, you can easily narrow down exact items of need for an ease of procurement. With our quotation service in mind, be sure to submit a completed form when you are ready to begin. Should you wish to speak with one of our representatives to discuss services, you can also give us a call or email at your convenience. With all that we offer, choose Aerospace Engineering Solutions for part number 7031-C-60 and other NSN items of need.

Characteristics Data of NSN 6625-00-008-0395, 6625000080395

MRC	Criteria	Characteristic
MATT	Material	TIN 2ND POSITION SHIELD BRAID, METALLIC ALL CONDUCTORS
MATT	Material	COPPER 1ST POSITION SHIELD BRAID, METALLIC ALL CONDUCTORS
MRC	Decoded Requirement	Clear Text Reply
CXCW	Conductor Form	STRANDED ALL CONDUCTORS
CXDC	Round Conductor Size	19 AWG ALL CONDUCTORS
ZZZV	Fsc Application Data	TEST SET,ELECTRONIC SYSTEMS,EXCEPT SPECIALLY DESIGNED